 Qcept Technologies is the world leader in Non-Visual Defect (NVD) inspection. Our ChemetriQ® inspection systems enable fabs to improve yield by detecting
Non-Visual Defects (NVD), sub-monolayer metallic and organic contamination,
and other yield-killing surface non-uniformities that cannot be seen by optical
tools.
March 2009 SPCC 2009 - Austin "Optimization of Edge Clean Using Non-visual Defect Inspection " by L. Gabette, A. Danel of CEA-LETI, MINATEC, P. Besson of ST Microelectronics, R. Spicer, B. Usry, D. Peters, R. Newcomb of Qcept Technologies March 2009 Semiconductor International "Controlling Process-Induced Charging Heightens Productivity" by Ralph Spicer, Jeff Hawthorne, Darryl Peters, Robert Newcomb of Qcept Technologies March 2009 Fabtech "Qcept Technologies' NVD Inspection Solution to be Evaluated by Top Memory Manufacturer" by Jon Haines January 2009 WaferNEWS "Yield Management Strategies Need to Keep Pace with Semiconductor Innovation" by Erik Smith, President of Qcept Technologies December 2008 Fabtech "Soitec Adopts Qcept Technologies' NVD ChemetriQ" by Syanne Olson August 2008 Solid State Technology -Taiwan "Full-Wafer Post-Via Wet Clean Non-Visual Defect Inspection" Contributors- Dana Scranton, Jim Bryer, Semitool, Kalispell, MT USS and Robert Newcomb and Bill Usry of Qcept Technologies July 2008 Solid State Technology "Qcept gets a visual on defects " by Debra Vogler Video interview with Erik C. Smith, Qcept President, at MCA press reception, SEMICON West 2008 July 2008 WaferNEWS, Solid State Technology "Charge Signature Flags Non-Visual Defects" by Kathryn Derbyshire Interview with Erik Smith, Qcept President, at SEMICON West 2008 July 2008 EE Times "Video: Qcept says startups can survive downturn" by Mark LePedus Video interview of Erik Smith at SEMICON West 2008 addressing NVDs, inspection and metrology June 2008 Semiconductor International "SEMICON West 2008 Executive Outlook " May 2008 EE Times-Europe "CEA-Leti, Qcept partner on semi process development" Adrien Danel, lead research engineer at Leti, speaks about the partnership between Qcept and CEA-Leti to investigate techniques for characterizing leading-edge semiconductor materials and processes such as high-k and low-k dielectrics, atomic layer deposition (ALD), fully silicided (FUSI) metal gates and advanced cleaning technologies. April 2008 Semiconductor International "The Donut Mystery" Blog covering John Halladay's presentation at SPCC 2008. Topic: Qcept's ChemetriQ® 3000 results for Spansion's Fab 25. April 2008 April 2008 April 2008 SPCC 2008- Austin, TX R. Newcomb and R. Spicer of Qcept Technologies April 2008 January 2008
|
Frontiers of Characterization and Metrology for Nanoelectronics Qcept is participating in the poster session of the 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics held the week of May 11-15, 2009, at the College of Nanoscale Science and Engineering, University at Albany, Albany, New York.
|
 March 10, 2009 December 4, 2008 May 28, 2008 March 3, 2008 |
