 Our ChemetriQ® inspection systems enable fabs to improve yield by detecting
Non-Visual Defects (NVD), sub-monolayer metallic and organic contamination,
and other yield-killing surface non-uniformities that cannot be seen by optical
tools. Whether you’re in a high-volume, advanced fab, in pilot production, development or a research lab, there's a ChemetriQ tool that will enable you to improve yield and increase fab profitability.
October 2011 Semiconductor Manufacturing; & Design "Non-visual defect inspection gives fabs better eyes, new insights" by Katherine Derbyshire July 2011 Semicon West March 2011 ElectroIQ March 2011 FabTech "Tool Order: Two Leading IC Manufacturers Select Qcept's Non-Visual Defect Inspection System" by Mark Osborne February 2011 Solid State Technology October 2010 The Seventh International Surface Cleaning Workshop
July 2010 EE Times Video Interview at Semicon West with Ralph Spicer, VP Marketing of Qcept July 2010 ElectroIQ Blog Solid State Technology July 2010 R&D Magazine Next-generation NVD Inspection Solution for Patterned Wafers. July 2010 PC's Semiconductors Blog Qcept Technologies Intros Next-Generation NVD Inspection Solution for Patterned Wafers. March 2010 SEMATECH Surface Preparation and Cleaning Conference "Charge-Induced Attraction of Particles in Surface Preparation and Clean Processes"
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SPCC 2012March 19-21, 2012
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