2008 - Qcept received two additional U.S. patents: U.S. Patent No. 7,337,076 issued February 26, 2008 and U.S. Patent No. 7,379,826 issued May 27, 2008.

2007 - Qcept received two additional U.S. patents: U.S. Patent No. 7,308,367 issued December 11, 2007, U.S. Patent No. RE 39,803 issued September 4, 2007.

2006 - Qcept received four additional U.S. patents: U.S. Patent No. 7,092,826 issued August 15, 2006, U.S. Patent No. 7,103,482 issued September 5, 2006, U.S. Patent No. 7,107,158 issued September 12, 2006 and U.S. Patent No. 7,152,476 issued December 26, 2006.

2006 - Qcept received Certificate of Registration for the mark ChemetriQ® assigned U.S. Trademark Registration number 3,118,703 on July 26, 2006.

2005 - Qcept developed ChemetriQ family of inspection tools including the flagship ChemetriQ® 3000 Wafer Inspection System. 

2005 - Qcept issued Semiconductor Wafer Inspection System US Patent No.6,957,154 October 18, 2005.